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GaN-based HEMTs tested under high temperature storage test.

Denis MarconXuanwu KangJ. ViaeneMarleen Van HovePuneet SrivastavaStefaan DecoutereRobert P. MertensG. Borghs
Published in: Microelectron. Reliab. (2011)
Keyphrases
  • high temperature
  • data mining
  • test data
  • data storage
  • diesel engine
  • image processing
  • storage requirements