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On Applying Set Covering Models to Test Set Compaction.

Paulo F. FloresHorácio C. NetoJoão P. Marques Silva
Published in: Great Lakes Symposium on VLSI (1999)
Keyphrases
  • test set
  • set covering
  • error rate
  • training set
  • training data
  • test data
  • evaluation methodology
  • test cases
  • integer programming
  • database
  • data sets