Hyper-graph based partitioning to reduce DFT cost for pre-bond 3D-IC testing.

Amit Kumar Sudhakar M. Reddy Irith Pomeranz Bernd Becker

Published in: DATE (2011)

Keyphrases

testing process
test cases
frequency domain
software testing
significantly reduced
maintenance cost
partitioning algorithm
lower bound
wavelet transform
semi supervised
minimum cost
integrated circuit
high cost
graph theoretic
cost reduction