Login / Signup
Test cost reduction for SoC using a combined approach to test data compression and test scheduling.
Quming Zhou
Kedarnath J. Balakrishnan
Published in:
DATE (2007)
Keyphrases
</>
test data
test cases
training data
cost reduction
training set
training and test data
data sets
databases
machine learning
relational databases
high resolution
dynamic programming
test generation
wind tunnel