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Test cost reduction for SoC using a combined approach to test data compression and test scheduling.

Quming ZhouKedarnath J. Balakrishnan
Published in: DATE (2007)
Keyphrases
  • test data
  • test cases
  • training data
  • cost reduction
  • training set
  • training and test data
  • data sets
  • databases
  • machine learning
  • relational databases
  • high resolution
  • dynamic programming
  • test generation
  • wind tunnel