Login / Signup

Measurement of scattering coefficient dependence on soil moisture content and surface roughness by 35 GHz polarimetric scatterometer.

Tetsuya TagawaKen'ichi OkamotoAkira HiguchiTomoo UshioHiroshi Hanado
Published in: IGARSS (2004)
Keyphrases
  • surface roughness
  • specular reflection
  • manufacturing process
  • curved surfaces
  • viewpoint
  • surface shape
  • light source