Characterisation and modelling of parasitic effects and failure mechanisms in AlGaN/GaN HEMTs.
Nathalie MalbertNathalie LabatArnaud CurutchetC. SuryV. HoelJ.-C. de JaegerNicolas DefranceY. DouvryChristian DuaMourad OualliC. Bru-ChevallierJean-Marie BluetW. ChikhaouiPublished in: Microelectron. Reliab. (2009)