A subgap density of states modeling for the transient characteristics in oxide-based thin-film transistors.

Published in: Microelectron. Reliab. (2016)

Keyphrases

thin film
high density
electron microscopy
low density
room temperature
silicon nitride
short circuit
multi layer
genetic algorithm
solar cell
field effect transistors
integrated circuit
grain size
power consumption
steady state
learning algorithm
machine learning
white light interferometry