Impact of temporal transistor variations on circuit reliability.
Runsheng WangYu CaoPublished in: ISCAS (2015)
Keyphrases
- high speed
- circuit design
- low power
- temporal constraints
- spatio temporal
- spatial and temporal
- temporal information
- equivalent circuit
- temporal characteristics
- logic circuits
- power dissipation
- temporal data
- reliability analysis
- temporal consistency
- temporal dimension
- temporal patterns
- integrated circuit
- temporal analysis
- real time
- highly reliable
- low cost
- failure rate
- steady state
- space time
- website