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Tier Degradation of Monolithic 3-D ICs: A Power Performance Study at Different Technology Nodes.
Shreepad Panth
Sandeep Kumar Samal
Kambiz Samadi
Yang Du
Sung Kyu Lim
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2017)
Keyphrases
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statistical analysis
rapid development
shortest path
theoretical framework
power consumption
key technologies
e learning
experimental study
integrity constraints
personal computer
factors affecting
technology adoption
key findings