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Robust autotuning MPC for a class of process control applications.
Clara M. Ionescu
Dana Copot
Anca Maxim
Eva-Henrietta Dulf
Roxana Both
Robin De Keyser
Published in:
AQTR (2016)
Keyphrases
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process control
control system
intelligent control
product quality
semiconductor manufacturing
closed loop
manufacturing process
life cycle
robust estimation
graduate education
image processing
decision trees
case study
pid controller
control law
multi class classification