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Series resistance and oxide thickness spread influence on Weibull breakdown distribution: New experimental correction for reliability projection improvement.

David RoyS. BruyèreE. VincentFrederic Monsieur
Published in: Microelectron. Reliab. (2002)
Keyphrases
  • log normal
  • real world
  • statistical analysis
  • database
  • neural network
  • error correction
  • cross section