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Stitch-avoiding Detailed Routing for Multiple E-Beam Lithography.

Kritanta SahaPritha BanerjeeSusmita Sur-Kolay
Published in: VLSI-SoC (2022)
Keyphrases
  • electron beam
  • databases
  • response time
  • neural network
  • real world
  • data mining
  • artificial intelligence
  • image processing
  • website
  • decision trees
  • similarity measure
  • medical images
  • routing problem
  • reinforced concrete