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Sample Holders for Sub-THz Electron Spin Resonance Spectroscopy.
Antonín Sojka
Matús Sedivý
Adam Lagin
Andrej Gabris
Tomás Láznicka
Vinicius Tadeu Santana
Oleksii Laguta
Petr Neugebauer
Published in:
IEEE Trans. Instrum. Meas. (2022)
Keyphrases
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electron microscopy
x ray
infrared
electron beam
thin film
small sample
randomly selected
metal oxide
electron microscope
nuclear magnetic resonance
electric field
sample set
database
sample size
semi supervised
artificial neural networks
training data
data sets