A fast and accurate per-cell dynamic IR-drop estimation method for at-speed scan test pattern validation.
Yuta YamatoTomokazu YonedaKazumi HatayamaMichiko InouePublished in: ITC (2012)
Keyphrases
- highly accurate
- high accuracy
- detection method
- experimental evaluation
- neural network
- computationally efficient
- preprocessing
- significant improvement
- estimation accuracy
- density estimation
- error analysis
- cost function
- maximum likelihood estimation
- statistical significance
- text retrieval
- support vector machine svm
- test data
- classification method
- segmentation method
- pattern matching
- clustering method
- dynamic environments
- denoising
- classification accuracy
- computational cost
- dynamic programming
- information retrieval