A Wavelet Transform Based Multi-Resolution Approach to Edge Profile Detection and Classification.
Guillermo Palacios NavarroPedro Ramos LorenteRaquel Lacuesta GilabertePublished in: IPCV (2010)
Keyphrases
- multiresolution
- feature extraction and classification
- wavelet transform
- feature extraction
- wavelet coefficients
- classification accuracy
- classification scheme
- automatic detection
- classification algorithm
- support vector machine
- wavelet domain
- pattern recognition
- supervised learning
- automatic classification
- image classification
- pattern classification
- robust detection
- feature selection
- support vector
- edge detection
- low bit rate image coding
- neyman pearson
- multi resolution analysis
- machine learning
- training set
- filter bank
- detection method
- false positives
- texture analysis
- support vector machine svm
- anomaly detection
- classification models
- user profiles
- detection rate
- wavelet decomposition
- wavelet transformation
- multiresolution analysis
- classification method
- support vector machine classifier
- class labels