Login / Signup
Experimental investigation into radiation-hardening-by-design (RHBD) flip-flop designs in a 65nm CMOS process.
Tong Lin
Kwen-Siong Chong
Wei Shu
Ne Kyaw Zwa Lwin
Jize Jiang
Joseph S. Chang
Published in:
ISCAS (2016)
Keyphrases
</>
design space
design principles
design tools
x ray
nm technology
low power
design methodology
cmos technology