Driver circuits for temperature-invariant performance of junction diodes.
Subhash Chandra B.Raj Vir SinghVinesh Kumar GargPublished in: IET Circuits Devices Syst. (2009)
Keyphrases
- tunnel diode
- room temperature
- affine transformation
- high speed
- moment invariants
- analog circuits
- affine invariant
- transmission line
- intelligent vehicles
- logic circuits
- delay insensitive
- space charge
- road safety
- real time
- invariant features
- driving simulator
- thermal imaging
- vlsi circuits
- quantum computing
- driver assistance systems
- invariant properties
- high density