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On Accumulator-Based Bit-Serial Test Response Compaction Schemes.

Dimitris BakalisDimitris NikolosHaridimos T. VergosXrysovalantis Kavousianos
Published in: ISQED (2001)
Keyphrases
  • hough transform
  • neural network
  • database
  • data sets
  • real world
  • artificial intelligence
  • case study
  • data structure
  • multiresolution