Login / Signup

On Generating Pseudo-Functional Delay Fault Tests for Scan Designs.

Zhuo ZhangSudhakar M. ReddyIrith Pomeranz
Published in: DFT (2005)
Keyphrases
  • fault diagnosis
  • fault detection
  • real time
  • critical path
  • generation process
  • neural network
  • website
  • multiscale
  • design tools
  • automatically generating