Dynamic critical resistance: a timing-based critical resistance model for statistical delay testing of nanometer ICs.
José Luis RossellóCarol de BenitoSebastià A. BotaJaume SeguraPublished in: DATE (2007)
Keyphrases
- experimental data
- formal model
- statistical models
- dynamic environments
- high level
- conceptual model
- test data
- statistical approaches
- mathematical model
- theoretical framework
- theoretical analysis
- probability distribution
- cost function
- prior knowledge
- computational model
- parameter estimation
- statistical model
- multi agent
- statistical information
- data sets