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Feedback scheme for improved lateral force measurement in atomic force microscopy.

A. ShegaonkarChibum LeeSrinivasa M. Salapaka
Published in: ACC (2008)
Keyphrases
  • atomic force microscopy
  • real time
  • information retrieval
  • learning scheme
  • detection scheme
  • database
  • neural network
  • case study
  • multiscale
  • improved algorithm
  • representation scheme