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Bridging Defects Resistance Measurements in a CMOS Process.

Rosa Rodríguez-MontañésJoan FiguerasEric Bruls
Published in: ITC (1992)
Keyphrases
  • defect detection
  • measurement data
  • measurement noise
  • genetic algorithm
  • measured data
  • sensor measurements
  • knowledge base
  • search algorithm
  • digital libraries
  • multiresolution
  • automated visual inspection