An efficient yield optimization method for analog circuits via gaussian process classification and varying-sigma sampling.
Xiaodong WangChanghao YanFan YangDian ZhouXuan ZengPublished in: DAC (2022)
Keyphrases
- optimization method
- analog circuits
- gaussian process classification
- optimization algorithm
- optimization methods
- differential evolution
- genetic algorithm
- digital circuits
- optimization procedure
- particle swarm
- evolutionary algorithm
- fault diagnosis
- simulated annealing
- metaheuristic
- gaussian process
- neural network
- nelder mead simplex
- random sampling
- expectation propagation
- regression model
- sample size
- markov random field
- multi objective