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Model-Based Identification of Nanomechanical Properties in Atomic Force Microscopy: Theory and Experiments.
Michael R. P. Ragazzon
Jan Tommy Gravdahl
Kristin Ytterstad Pettersen
Published in:
IEEE Trans. Control. Syst. Technol. (2019)
Keyphrases
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atomic force microscopy
theoretical framework
databases
structural properties
desirable properties
genetic algorithm
theoretical basis
data sets
computer vision
search algorithm
relational databases
information theory
general theory