A Novel Chip-on-Board Defect Detection Approach Combining Infrared Thermal Evolution and Self-Supervised Transformer.
Ye JiangZhiyong LiuGuanglan LiaoBo MaPublished in: IEEE Trans. Ind. Informatics (2024)
Keyphrases
- infrared
- defect detection
- focal plane
- visible spectrum
- fault diagnosis
- infrared images
- thermal infrared
- multi sensor
- feature extraction
- thermal images
- fuzzy logic
- infrared imagery
- high speed
- thermal imaging
- hyperspectral
- target detection and tracking
- nonsubsampled contourlet transform
- automatic target recognition
- infrared sensors
- night vision
- target detection
- image registration
- electro optical
- real time
- gaze tracking
- non stationary
- time of flight