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Percolative approach for failure time prediction of thin film interconnects under high current stress.

E. MisraMd. M. IslamMahbub HasanH. C. KimT. L. Alford
Published in: Microelectron. Reliab. (2005)
Keyphrases
  • thin film
  • short circuit
  • prediction accuracy
  • input output
  • high density
  • failure prediction
  • grain size
  • database
  • databases
  • decision support system
  • prediction model
  • electron microscopy
  • solar cell