Improving the scan rate and image quality in tapping Mode Atomic Force Microscopy with piezoelectric shunt control.
Matthew W. FairbairnS. O. Reza MoheimaniAndrew J. FlemingPublished in: AuCC (2011)
Keyphrases
- image quality
- atomic force microscopy
- bit rate
- visual quality
- human visual system
- quality assessment
- reconstructed image
- compression ratio
- image resolution
- control method
- high quality
- image data
- control system
- low complexity
- control strategy
- mathematical model
- gray scale
- mobile robot
- matlab simulink
- quality prediction
- high voltage
- standard test images