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Impacts of NBTI and PBTI on SRAM static/dynamic noise margins and cell failure probability.
Aditya Bansal
Rahul M. Rao
Jae-Joon Kim
Sufi Zafar
James H. Stathis
Ching-Te Chuang
Published in:
Microelectron. Reliab. (2009)
Keyphrases
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noise reduction
signal to noise ratio
noise level
noisy environments
probability distribution
power consumption
data sets
image processing
multiscale
training set
low cost
dynamic environments
noisy images
dynamic analysis