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Modeling of Physical Defects in PN Junction Based Graphene Devices.

Sandeep MiryalaMatheus OleiroLetícia Maria Bolzani PöhlsAndrea CalimeraEnrico MaciiMassimo Poncino
Published in: J. Electron. Test. (2014)
Keyphrases
  • mobile devices
  • defect detection
  • databases
  • petri net
  • physical world
  • physical processes
  • database
  • real time
  • data sets
  • information systems
  • image processing
  • modeling framework