Ball-Grid-Array Chip Defects Detection and Classification Using Patch-based Modified YOLOv3.
Phong-Phu LeShu-Mei GuoJu-Chin ChenJenn-Jier James LienPublished in: TAAI (2019)
Keyphrases
- pattern recognition
- decision trees
- machine learning
- anomaly detection
- microcalcification clusters
- programmable logic
- classification scheme
- automatic classification
- image classification
- feature extraction
- classification accuracy
- classification method
- training set
- automatic detection
- classification algorithm
- detection method
- detection algorithm
- support vector machine svm
- high speed
- pattern classification
- high density
- feature extraction and classification
- support vector
- object detection
- feature vectors
- class labels
- text classification
- support vector machine
- detection rate
- classification models
- low cost
- feature space
- grid computing