Sample-imbalanced wafer map defects classification based on auxiliary classifier denoising diffusion probability model.
Jialin LiRan TaoRenxiang ChenYongpeng ChenChengying ZhaoXianzhen HuangPublished in: Comput. Ind. Eng. (2024)
Keyphrases
- probability model
- denoising
- classification scheme
- classification algorithm
- classification method
- small sample
- class labels
- classification process
- support vector
- binary classification problems
- feature selection
- multiple classifiers
- decision trees
- training set
- training samples
- classification models
- nearest neighbor classifier
- classifier combination
- classification accuracy
- classification rate
- feature space
- support vector machine
- svm classifier
- single class
- learning vector quantization
- probabilistic classifiers
- feature set
- feature vectors
- binary classifiers
- text classification
- representative samples
- multiclass classification
- image denoising
- decision boundary
- nearest neighbour
- feature extraction
- imbalanced data sets
- multi class
- model selection
- support vector machine svm
- statistical model
- total variation
- pattern classification
- minority class
- feature maps
- class imbalance
- anisotropic diffusion
- classifier ensemble
- multiple classifier systems
- roc curve
- bayesian classifier
- feature selection algorithms
- machine learning