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A Novel System to Increase Yield of Manufacturing Test of an RF Transceiver through Application of Machine Learning.

Atif SiddiquiPablo OteroMuhammad Zubair
Published in: Sensors (2023)
Keyphrases
  • machine learning
  • relevance feedback
  • test cases
  • test data
  • manufacturing systems
  • quality control
  • information retrieval
  • statistical significance
  • frequency band
  • manufacturing processes