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A Novel Approach to Automate IoT Testing of Gateways and Devices.
Chien-Hung Liu
Wen-Yew Liang
Ming-Yi Tsai
Wei-Che Chang
Woei-Kae Chen
Published in:
J. Inf. Sci. Eng. (2022)
Keyphrases
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management system
test cases
databases
machine learning
information retrieval
cloud computing
test data
real time
data sets
e learning
wireless sensor networks
big data
test suite
electronic devices
smart objects