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HotCluster: A Thermal-Aware Defect Recovery Method for Through-Silicon-Vias Toward Reliable 3-D ICs Systems.
Khanh N. Dang
Akram Ben Ahmed
Abderazek Ben Abdallah
Xuan-Tu Tran
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2022)
Keyphrases
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similarity measure
computationally efficient
highly accurate
segmentation method
detection method
experimental evaluation
computational cost
high accuracy
synthetic data
objective function
classification method
support vector machine
management system
edge detection
model selection
training set
data sets