A Practical Logic BIST for ASIC Designs.

Yasuo Sato Motoyuki Sato Koki Tsutsumida Toyohito Ikeya Masatoshi Kawashima

Published in: Asian Test Symposium (2001)

Keyphrases

integrated circuit
built in self test
hardware implementation
application specific integrated circuits
real world
design methodology
practical problems
application specific
database
design principles
practical application
multi valued
data mining
logic programming
single chip