testing of low-voltage CMOS circuits using leakage control techniques.

Zhanping Chen Liqiong Wei Kaushik Roy

Published in: IEEE Trans. Very Large Scale Integr. Syst. (2001)

Keyphrases

low voltage
cmos technology
random access memory
design considerations
leakage current
power line
low power
power management
high speed
control system
power consumption
mixed signal
real time
image processing
low cost