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An experimental analysis of spot defects in SRAMs: realistic fault models and tests.

Said HamdiouiAd J. van de Goor
Published in: Asian Test Symposium (2000)
Keyphrases
  • fault models
  • model based diagnosis
  • fault model
  • fault management
  • conflict resolution
  • horn clauses
  • database
  • machine learning
  • artificial intelligence
  • probability distribution