Feature extraction and validation within a flexible manufacturing protocol.
B. KumarDavinder K. AnandM. AnjanappaJ. A. KirkPublished in: Knowl. Based Syst. (1993)
Keyphrases
- feature extraction
- lightweight
- preprocessing
- pattern classification
- wavelet transform
- face recognition
- feature space
- formal analysis
- feature vectors
- cryptographic protocols
- pattern recognition
- image processing
- dimensionality reduction
- application layer
- linear discriminant analysis
- tcp ip
- defect detection
- image preprocessing
- security protocols
- network protocols
- file transfer
- texture analysis
- discriminant analysis
- texture features
- image classification
- principal component analysis
- feature selection
- dimension reduction
- texture classification
- multi party
- data sets
- authentication protocol
- communication protocol
- digital libraries
- computer vision
- neural network