An ATE architecture for implementing very high efficiency concurrent testing.
Takahiro NakajimaTakeshi YaguchiHajime SugimuraPublished in: ITC (2012)
Keyphrases
- high efficiency
- high accuracy
- real and synthetic datasets
- memory space
- result quality
- management system
- test data
- software architecture
- concurrent programs
- hardware implementation
- real time
- density based clustering
- code generation
- object model
- databases
- conceptual model
- test set
- case study
- hardware architecture
- website
- data sets
- layered architecture
- database