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Cost-effective LFSR synthesis for optimal pseudoexhaustive BIST test sets.
Dimitrios Kagaris
Spyros Tragoudas
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (1993)
Keyphrases
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cost effective
test set
low cost
cost effectiveness
training set
error rate
test cases
data center
evaluation methodology
data sets
optimal solution
feature vectors
long term
test data
image processing
training data