Embedding statistical tests for on-chip dynamic voltage and temperature monitoring.
Lionel VincentPhilippe MaurineSuzanne LesecqEdith BeignéPublished in: DAC (2012)
Keyphrases
- statistical tests
- statistically significant
- high speed
- hypothesis testing
- monitoring system
- statistical analysis
- dynamic environments
- statistical significance
- sample size
- independent variables
- room temperature
- real time
- power system
- low cost
- electric field
- high density
- method reduces the number
- statistical methods
- pairwise
- learning environment
- data mining
- real world