An adaptive heuristic algorithm for VLSI test vectors selection.

Walid Ibrahim Hesham El-Sayed Amr El-Chouemi Hoda H. Amer

Published in: Eur. J. Oper. Res. (2009)

Keyphrases

data sets
test cases
feature vectors
high speed
selection strategy
real time
signal processing
test data
random selection
vlsi design
databases
neural network
image processing
training set
selection criteria