Modeling the Dependency of Analog Circuit Performance Parameters on Manufacturing Process Variations With Applications in Sensitivity Analysis and Yield Prediction.
Elena-Diana SandruEmilian DavidIngrid KovacsAndi BuzoCorneliu BurileanuGeorg PelzPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2022)
Keyphrases
- sensitivity analysis
- manufacturing process
- analog circuits
- managerial insights
- process control
- quality control
- variational inequalities
- manufacturing systems
- fault diagnosis
- discrete event
- neural network
- control system
- modeling method
- product design
- decision variables
- product quality
- decision making
- vision system
- case study
- information systems
- machine learning