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Long time stability of electrical contact base on ruthenium nanoscale films at various coating roughness.

Sergey M. KarabanovDmitry V. SuvorovGennadiy P. GololobovViktor S. GurovDmitry Yu. TarabrinEvgeny V. Slivkin
Published in: RTSI (2015)
Keyphrases
  • electrical properties
  • short circuit
  • stability analysis
  • transmission line
  • distribution networks
  • grain size
  • atomic force microscopy
  • data sets
  • fractal dimension
  • power grid
  • asymptotic stability