Hot-carrier-reliability design guidelines for CMOS logic circuits.
Khandker N. QuaderEric R. MinamiWei-Jen HuangPing K. KoChenming HuPublished in: IEEE J. Solid State Circuits (1994)
Keyphrases
- logic circuits
- design guidelines
- low power
- power consumption
- high speed
- low cost
- power dissipation
- design issues
- user interface
- interface design
- tunnel diode
- educational games
- functional decomposition
- user groups
- digital signal processing
- design principles
- image analysis
- design process
- real time
- circuit design
- human computer interaction