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Reliability of key technologies in 3D integration.

Cheng-Ta KoKuan-Neng Chen
Published in: Microelectron. Reliab. (2013)
Keyphrases
  • key technologies
  • information integration
  • failure rate
  • neural network
  • three dimensional
  • digital libraries
  • data integration
  • machine learning
  • multimedia
  • similarity measure
  • data structure
  • heterogeneous databases