Login / Signup

Cross-Validation of Data Compatibility Between Small Angle X-ray Scattering and Cryo-Electron Microscopy.

Jin Seob KimBijan AfsariGregory S. Chirikjian
Published in: J. Comput. Biol. (2017)
Keyphrases
  • electron microscopy
  • x ray
  • cross validation
  • image stacks
  • low energy
  • model selection
  • data sets
  • medical imaging
  • tomographic images
  • x ray images
  • three dimensional
  • cone beam
  • training set
  • thin film
  • error estimates