A test-application-count based learning technique for test time reduction.

Guo-Yu Lin Kun-Han Tsai Jiun-Lang Huang Wu-Tung Cheng

Published in: VLSI-DAT (2015)

Keyphrases

learning process
incremental learning
learning algorithm
supervised learning
learning scheme
experimental design
conducted an empirical study
knowledge base
decision trees
multi agent
empirical studies
learning systems
test cases
learning community