Digital built-in self-test of CMOS analog iterative decoders.
Mimi YiuChris WinsteadVincent C. GaudetChristian SchlegelPublished in: ISCAS (3) (2005)
Keyphrases
- circuit design
- mixed signal
- cmos image sensor
- analog vlsi
- low power
- multi channel
- vlsi circuits
- analog to digital converter
- dynamic range
- single chip
- solid state
- digital circuits
- built in self test
- cmos technology
- delta sigma
- focal plane
- power consumption
- low cost
- processing capabilities
- image sensor
- parallel processing
- power supply
- low voltage
- signal processing
- printed circuit
- wide dynamic range
- genetic algorithm
- real time