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Static test compaction for synchronous sequential circuits based on vector restoration.
Irith Pomeranz
Sudhakar M. Reddy
Ruifeng Guo
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1999)
Keyphrases
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image restoration
search algorithm
artificial neural networks
statistical tests
vector valued functions
data sets
neural network
social networks
image processing
case study
multiscale
feature vectors
high speed
digital circuits
vector data
sequential search